August 18-22, 2019 Xi’an, P. R. CHINA
www.pricm10.com
This triennial conference is the 10th in a series of international conferences devoted to advanced materials and processing. PRICM Conference is jointly sponsored by The Chinese Society for Metals (CSM), The Japan Institute of Metals and Materials (JIM), The Korean Institute of Metals and Materials (KIM), Materials Australia (MA), and The Minerals, Metals & Materials Society (TMS) and organized in rotation among these sponsoring organizations from 1992 in Hangzhou, China. The purpose of PRICM is to provide an attractive forum for the exchange of scientific and technological information on advanced materials and processing.
After 27 years, it is the third round of PRICM Conferences hosted by China. Based on the excellent performance of those previous conferences and collaborative efforts of CSM, JIM, KIM, MA and TMS, PRICM-10 will be a new leap for PRICM Conferences.
Organized and Sponsored by:
Organized by
The Chinese Society for Metals (CSM)
Sponsored by
The Chinese Society for Metals (CSM)
The Japan Institute of Metals and Materials (JIM)
The Korean Institute of Metals and Materials (KIM)
Materials Australia (MA)
The Minerals, Metals & Materials Society (TMS)
Topics of Symposium H: Materials Characterization and Evaluation
The symposium aims at covering and discussing the state-of-the-art developments in the fields of materials characterization and evaluation, bringing together scientists and engineers working in the forefront of the discipline. It will focus on the advanced characterization and evaluation techniques, including but not limited to all forms of microscopy (light, electron, acoustic, etc.,) and their wide application to evaluate the quantification of the microstructure of materials. Furthermore, discussions on the evaluation of the data through computer analyses are also encouraged.
Partial list of topics:
In situ transmission electron microscopy/scanning electron microscopy
Aberration-corrected high resolution electron microscopy
Scanning transmission electron microscopy
X-ray diffraction/Synchrotron XRD
Raman Spectroscopy
Optical Interferometry
Electron backscattered diffraction analysis
Nonlinear Ultrasonics
Symposium Organizers
CSM:
Zhiwei SHAN, Xi'an Jiaotong University, Email: zwshan@mail.xjtu.edu.cn
Xiaodong HAN, Beijing University of Technology, Email: xdhan@bjut.edu.cn
JIM:
Satoshi HATA, Kyushu University, Email: hata.satoshi.207@m.kyushu-u.ac.jp
KIM:
Ju-Young KIM, Ulsan Institute of Science and Technology (UNIST), Email:juyoung@unist.ac.kr
MA
Jin ZOU, University of Queensland, Email: j.zou@uq.edu.au
TMS
Jennifer CARTER, Case Western Reserve, Email: jwc137@case.edu
Abstract Submission
Deadline: January 31, 2019
Website: www.pricm10.com
If there are any problems during the submission process, please contact the Conference Secretariat:
Tel.: +86-10-65211206
Fax: +86-10-65124122
Email: pricm10@csm.org.cn
