(1)   Microstructural properties of low-dimensional materials

(2)   Interface structure and defects analysis at sub-angstrom resolution using (S)TEM

(3)   Quantitative high-resolution electron microscopy and its application in material science

06/2014—now Materials Science and Engineering, Xi’an Jiaotong University, Professor.

06/2009—06/2014 Institute of Metal Research, CAS, Research Professor.

09/2003—09/2009 Ernst Ruska-Centre Juelich, Germany, Research Fellow.

09/2000—09/2003 Research Centre Juelich, Germany, Visiting Ph.D Candidate.

09/2000—07/2003 School of Materials Science and Engineering, Dalian University of Technology, Doctor.

09/1997—07/2000 School of Materials Science and Engineering, Dalian University of Technology, Master.

09/1990—07/1994 School of Materials Science and Engineering, Dalian University of Technology, Bachelor.

The “Hundred Talents Program” of Chinese Academy of Sciences (2010).

Young Talent Support Plan of XJTU (2015)

(1)   Shao-Bo Mi*, Chun-Lin Jia, Ionela Vrejoiu, Marin Alexe and Dietrich Hesse, "Atomic-Scale Structure and Properties of Epitaxial PbZr_0.2Ti_0.8O₃/SrRuO₃ Heterointerfaces". Advanced Materials Interfaces, 2: 201500087, 2015.

(2)   C. L. Jia*, S.B. Mi, J. Barthel, D.W. Wang, R.E. Dunin-Borkowski, K.W. Urban and A. Thust, “Determination of the 3D shape of a nanoscale crystal with atomic resolution from a single image”. Nature Materials, 13: 1044-1049, 2014.

(3)   S. B. Mi*, C. L. Jia, Q.T. Zhao, S. Mantl and K. Urban, “NiSi₂/Si interface chemistry and epitaxial growth mode”. Acta Materialia, 57: 232-236, 2009.

(4)   C. L. Jia*, S.B. Mi, K. Urban, I. Vrejoiu, M. Alexe and D. Hesse, “Atomic-scale study of electric dipoles near charged and uncharged domain walls in ferroelectric films”. Nature Materials, 7: 57-61, 2008.